High Voltage 2KV THB Board
Reliability Testing Board for THB (Temperature Humidity Bias) for High-Voltage Smart Power Devices
PRODUCT DESIGNED FOR HIGH-VOLTAGE TEMPERATURE AND HUMIDITY TESTING OF SEMICONDUCTOR DEVICES
Board size 150x500 mm. The board allows for stressing multiple DUT (Device Under Test) positions under static conditions at the maximum parameters declared in the datasheet (AMR/MOV) in a high-temperature environment up to 150°C and 85% humidity. The design supports High Voltage stress up to 2000V. It is also possible to add external conditioning (stimuli) to communicate with the device and monitor its behavior.
2BiTS was responsible for:
- Design Schematic + Layout
- PCB Production and Assembly
- CQ Verification
- Debugging
- Support for on-site Start Trial activities
- Post-sale support
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